A study day promoted by Cubit, Rohde & Schwarz, Analytical and ALLdata, addressing the various aspects of verifying device compliance with EMC standards — factors that must be taken into account during development and design in order to reduce testing and certification times and a product’s time-to-market.
In recent years, the use of an ever-growing number of electronic devices and components has created “electromagnetically complex” environments, in which the level of measurement uncertainty in EMC testing is far from negligible. Given the complexity of the subject, a central theme is the optimisation of resources through the automation of measurement systems, which makes a measurement faster, more repeatable and more reproducible while minimising error.
Innovating the world of testing means enabling companies to achieve excellence and maintain a lasting competitive advantage. “We need to address requirements not only for acquiring and controlling measurements, but also for analysing and presenting them,” says Gianluca Lerose, Test Engineer at Cubit. “Customising the software tool can improve the quality and repeatability of measurements, ensure sustained performance and automate processes, cutting working times.”
We will discuss all of this on 5 May 2022, from 9:00 a.m. at the Navacchio Technology Park.
Click here for the speakers’ abstracts and bios.
The workshop is free but places are limited. Registration is required and will close once all places are filled.
GREEN PASS: the rules in force on the day of the event will apply.
PROGRAMME
EMC Day: the many facets of electromagnetic compatibility
Navacchio Technology Park, via Giuntini 13 – Cascina (PI)
| 9:00 a.m. | Welcome and participant registration |
| 9:30 a.m. | Welcome and introduction Luigi Soffientini – Area Manager – ALLdata S.r.l. |
| 9:40 a.m. | Simulation methods for electromagnetic compatibility Prof. Giuliano Manara – Full Professor of Electromagnetic Fields, Department of Information Engineering, University of Pisa |
| 10:00 a.m. | Techniques for optimising pre-compliance testing Luigi Lorusso – Channel Sales Engineer, Rohde & Schwarz Italia S.p.A. |
| 10:20 a.m. | Conformity assessment in electromagnetic compatibility and the role of measurement uncertainty Silvia Storai – Head of the Electromechanical BU, Analytical S.r.l. |
| 10:40 a.m. | Coffee break |
| 11:00 a.m. | Integrating instrumentation into EMC measurements to improve the measurement process Gianluca Lerose – Test Engineer, Cubit Innovation Labs |
| 11:20 a.m. | Q&A session |
| 11:40 a.m. | Tour of the Analytical laboratory |
| 12:30 p.m. | Close of proceedings |
